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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Suresha K | |
dc.contributor.author | Naik P.S. | |
dc.date.accessioned | 2020-06-12T15:08:51Z | - |
dc.date.available | 2020-06-12T15:08:51Z | - |
dc.date.issued | 2001 | |
dc.identifier.citation | Physics of Low-Dimensional Structures , Vol. 2001 , 44084 , p. 39 - 48 | en_US |
dc.identifier.uri | http://gukir.inflibnet.ac.in:8080/jspui/handle/123456789/5798 | - |
dc.description.abstract | We have calculated the energy loss per electron via acoustic phonons assuming degenerate statistics for two-dimensional (2D) hot electron gas of silicon inversion layer of MOSFET structure in the electron temperature range 0.15K< | en_US |
dc.publisher | 1.7K. It is found that the energy loss rates from the electron-phonon interaction are proportional to T5 for the screened case. At low temperatures our results are in good agreement with those obtained from recent experimental data. | |
dc.subject | Te < | |
dc.title | Energy Loss Rates in Silicon Inversion Layer of MOSFET Structure | en_US |
Appears in Collections: | 1. Journal Articles |
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