Please use this identifier to cite or link to this item: http://gukir.inflibnet.ac.in:8080/jspui/handle/123456789/4680
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dc.contributor.authorIkram I.M
dc.contributor.authorRabinal M.K
dc.contributor.authorMulimani B.G.
dc.date.accessioned2020-06-12T15:04:32Z-
dc.date.available2020-06-12T15:04:32Z-
dc.date.issued2009
dc.identifier.citationEuropean Journal of Physics , Vol. 30 , 1 , p. 127 - 134en_US
dc.identifier.uri10.1088/0143-0807/30/1/012
dc.identifier.urihttp://gukir.inflibnet.ac.in:8080/jspui/handle/123456789/4680-
dc.description.abstractHere, we propose a simple method for measuring the built-in potential and its temperature dependence of a photodiode by a photosaturation technique. The experimental design facilitates both current-voltage and null voltage measurements as a function of white light intensity. This method gives the built-in potential directly; as a result its temperature dependence can conveniently be measured by using commercial photodiodes. The values obtained are quite close to the expected ones. Therefore, the technique can easily be adopted as a laboratory experiment in graduate/undergraduate courses to measure the built-in potential. © 2009 IOP Publishing Ltd.en_US
dc.titleA laboratory experiment to measure the built-in potential of a p-n junction by a photosaturation methoden_US
dc.typeArticle
Appears in Collections:1. Journal Articles

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