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DC Field | Value | Language |
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dc.contributor.author | Ikram I.M | |
dc.contributor.author | Rabinal M.K | |
dc.contributor.author | Mulimani B.G. | |
dc.date.accessioned | 2020-06-12T15:04:32Z | - |
dc.date.available | 2020-06-12T15:04:32Z | - |
dc.date.issued | 2009 | |
dc.identifier.citation | European Journal of Physics , Vol. 30 , 1 , p. 127 - 134 | en_US |
dc.identifier.uri | 10.1088/0143-0807/30/1/012 | |
dc.identifier.uri | http://gukir.inflibnet.ac.in:8080/jspui/handle/123456789/4680 | - |
dc.description.abstract | Here, we propose a simple method for measuring the built-in potential and its temperature dependence of a photodiode by a photosaturation technique. The experimental design facilitates both current-voltage and null voltage measurements as a function of white light intensity. This method gives the built-in potential directly; as a result its temperature dependence can conveniently be measured by using commercial photodiodes. The values obtained are quite close to the expected ones. Therefore, the technique can easily be adopted as a laboratory experiment in graduate/undergraduate courses to measure the built-in potential. © 2009 IOP Publishing Ltd. | en_US |
dc.title | A laboratory experiment to measure the built-in potential of a p-n junction by a photosaturation method | en_US |
dc.type | Article | |
Appears in Collections: | 1. Journal Articles |
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