Please use this identifier to cite or link to this item: http://gukir.inflibnet.ac.in:8080/jspui/handle/123456789/5078
Title: Structural, microstructural and dielectric studies of tin-doped barium niobate perovskite
Authors: Chitgopikar G
Chickpatil M
Raibagkar R.L.
Issue Date: 2006
Citation: Journal of Materials Science: Materials in Electronics , Vol. 17 , 11 , p. 963 - 970
Abstract: Monophasic oxides of the type Ba(Nb1-xSnx) O3 (0 ? x ? 1) have been synthesized by solid-state reaction method. All these compounds are found to have tetragonal structure except x = 1. The cell parameters and their variation with composition x have been determined. The X-ray density is found to increase gradually with increase of dopant concentration. Tolerance factor and volume of unit cell was found to be almost constant for all the compositions. Scanning electron microscopy showed the presence of grains of approximately 1 ?m in size. Dielectric measurements in the frequency range 100 Hz to 1 MHz and in the temperature range from -100°C to 500°C has been carried out to determine the dielectric parameters. A strong frequency dependence of both dielectric constant (??) and dielectric loss (D) is observed in the frequency range 100 Hz to 100 kHz. At low frequency, the piling up of mobile charge carriers at the grain boundary produces interfacial polarization giving rise to high dielectric constant. Dielectric loss showed a typical behaviour in the temperature and frequency range studied. © Springer Science+Business Media, LLC 2006.
URI: 10.1007/s10854-006-0035-y
http://gukir.inflibnet.ac.in:8080/jspui/handle/123456789/5078
Appears in Collections:1. Journal Articles

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.